Apparatus and method for testing semiconductor device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324754, G01R 3102

Patent

active

058015272

ABSTRACT:
A tester apparatus comprising a loader/unloader unit including a loader section for carrying a device, which have been carried to a carry-in section to a device-charging and -aligning section, and an unloader section for carrying device, which have been tested, from a device-discharging and -aligning section to a carry-out section, and a tester unit including carrier for carrying devices, which have been aligned at the device-charging and -aligning section, to a test position while carrying device, which have been tested, from the test position to a device-discharging and -aligning section, and a test section for electrically testing device at the test position to find whether the device is good or fault ones, wherein the tester unit is detachably connected to the loader/unloader unit.

REFERENCES:
patent: 4844565 (1989-07-01), Brafford et al.
patent: 4950982 (1990-08-01), Obikane et al.
patent: 5086270 (1992-02-01), Karasawa et al.
patent: 5151651 (1992-09-01), Shibata
patent: 5192908 (1993-03-01), Shibata
patent: 5196993 (1993-03-01), Herron et al.
patent: 5278494 (1994-01-01), Obigane

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and method for testing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for testing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for testing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-273036

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.