Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
Inventor
active
Defect inspection apparatus
Exposure apparatus and device manufacturing method
Foreign particle inspecting method and apparatus with correction
Foreign particle inspection apparatus
Optical detection system for detecting defects and/or particles
No associations
LandOfFree
Hideyuki Tashiro does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Hideyuki Tashiro, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Hideyuki Tashiro will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-560081