4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Heuristic Physics Laboratories

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Method for using inspection data for improving throughput of ste

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Patent

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Method for using wafer navigation to reduce testing times of int

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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