4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Having predetermined light transmission regions

Henri A. Khoury

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Chip registration mechanism

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Combined scanning force microscope and optical metrology tool

Optics: measuring and testing – By polarized light examination – With light attenuation
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Electron beam nano-metrology system

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
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Integrated tip strain sensor for use in combination with a singl

Measuring and testing – Surface and cutting edge testing – Roughness
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Integrated tip strain sensor for use in combination with a singl

Measuring and testing – Surface and cutting edge testing – Roughness
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Profile ID: LFUS-PAI-P-961512

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