4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Absorption

Heiner Otten

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Apparatus for measuring the thickness profile of rolled strips

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method and apparatus for texture analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Profile ID: LFUS-PAI-P-829623

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