Apparatus for measuring the thickness profile of rolled strips

Details Apparatus for measuring the thickness profile of rolled strips Apparatus for measuring the thickness profile of rolled strips

1986-08-20

1988-07-19

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Absorption

378146, G01B 1502

Patent

active

047590467

ABSTRACT:
To determine the thickness profile of rolled metal sheets by measuring the absorption of X-rays a slit diaphragm is used which is rotatable about the imaginary center axis of the X-ray tube, the rotation consisting of a reciprocating movement lying in a range of less than 36.degree.. Between the reversal points of the rotation the rotational movement takes place in steps with rest intervals lying therebetween.

REFERENCES:
patent: 3790799 (1974-02-01), Stein et al.
patent: 3866047 (1975-02-01), Honnsfield
patent: 4047036 (1977-09-01), Smith et al.
patent: 4132895 (1979-01-01), Froggatt
patent: 4490835 (1984-12-01), Wons
patent: 4517460 (1985-05-01), Menlenbrugge et al.
Translation of German Patent Application No. P 3425295.
Translation of German Patent No. 3140714.

Affiliated with

Also associated with

Rating

Apparatus for measuring the thickness profile of rolled strips does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for measuring the thickness profile of rolled strips, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for measuring the thickness profile of rolled strips will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-602020