4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Harsha Mysore Hatti

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Coined line analyzer

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

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Optical alignment fixture

Supports – Stand – To hold a particular article
Patent

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Pattern analyzer

Optics: measuring and testing – By shade or color
Patent

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System and method to quantify appearance defects in molded...

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate

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Profile ID: LFUS-PAI-P-701117

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