Optics: measuring and testing – By shade or color
Patent
1998-11-09
2000-06-20
Font, Frank G.
Optics: measuring and testing
By shade or color
250226, 356416, 356425, G01J 350, G01J 346
Patent
active
060783982
ABSTRACT:
A patterned sample is analyzed by traversing a light spot across the sample and analyzing detected color at several sites to spatially resolve the pattern. A pattern analyzer includes a holder for supporting the sample which is illuminated by projecting the light spot onto the sample. A color sensor receives light reflected by the sample at the light spot and analyzes color of the sample at the spot. The spot is traversed across the sample surface to obtain a plurality of color readings across the surface to spatially resolve the pattern.
REFERENCES:
patent: 3789983 (1974-02-01), Senesky
patent: 4061428 (1977-12-01), Amano et al.
patent: 4474470 (1984-10-01), Brabdt et al.
patent: 4652126 (1987-03-01), Mahooti
patent: 4881268 (1989-11-01), Uchida et al.
patent: 5120126 (1992-06-01), Wertz et al.
patent: 5559173 (1996-09-01), Campo et al.
patent: 5590251 (1996-12-01), Takagi
patent: 5642192 (1997-06-01), Gordon et al.
patent: 5650942 (1997-07-01), Granger
patent: 5831740 (1998-11-01), Terauchi
U.S. Patent Application, Ser. No. 08/926,084; filed Sep. 2, 1997, (RD-24814).
U.S. Patent Application, Ser. No. 09/075,913; filed May 11, 1998, (RD-25074).
Feldman Sandra Freedman
Hatti Harsha Mysore
Font Frank G.
General Electric Company
Lauchman Layla
Snyder Marvin
Stoner Douglas E.
LandOfFree
Pattern analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pattern analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pattern analyzer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1857857