Coined line analyzer

Details Coined line analyzer Coined line analyzer

1998-11-09

1999-08-24

Evans, F. L.

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

356378, 356446, 356 73, G01N 2188

Patent

active

059431270

ABSTRACT:
A sample having a coined line is analyzed by traversing a light spot across the sample, and then analyzing both specular and diffuse light reflected from the sample to spatially resolve the coined line. An analyzer includes a holder for supporting the sample which is illuminated by projecting the light spot onto the sample. Light collectors receive the specular and diffuse light from the sample at the spot. The received light is analyzed to detect changes therein indicative of the coined line.

REFERENCES:
patent: 4275966 (1981-06-01), Kleesattel
patent: 5559173 (1996-09-01), Campo et al.
patent: 5590251 (1996-12-01), Takagi
patent: 5642192 (1997-06-01), Gordon et al.
patent: 5650942 (1997-07-01), Granger
patent: 5859708 (1999-01-01), Feldman

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