Image analysis
Image transformation or preprocessing
Measuring image properties
Inventor
active
Adaptive mask technique for defect inspection
Automated direct patterned wafer inspection
Estimation of skew angle in text image
Method of edge detection in optical images using neural network
Subspace-based line detection
No associations
LandOfFree
Hamid K. Aghajan does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Hamid K. Aghajan, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Hamid K. Aghajan will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-657843