4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Hal C. McCown

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Scalable parallel test bus and testing method

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Systems for selectively disabling timing violations in...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Timing
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Profile ID: LFUS-PAI-P-2478539

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