4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Gye-Ho Ahn

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High speed sensing device in a semiconductor memory device

Static information storage and retrieval – Read/write circuit – Accelerating charge or discharge
Patent

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Method for multi-bit parallel test in semiconductor memory devic

Static information storage and retrieval – Read/write circuit – Testing
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Profile ID: LFUS-PAI-P-1514003

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