4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Gevorg Torjyan

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Apparatus, method, and system to allocate redundant components

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Apparatus, method, and system to allocate redundant...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Architecture, system and method for compressing repair data...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and apparatus for a command based bist for testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Methods and apparatuses that reduce the size of a repair...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2395522

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