4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Gerard S. de Ferron

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Device for neutralizing the access to an integrated-circuit zone

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Integrated memory having improved testing means

Static information storage and retrieval – Read/write circuit – Testing
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MOS technology voltage switch-over circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Safety device for electrically programmable read-only memory

Static information storage and retrieval – Floating gate – Particular biasing
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Profile ID: LFUS-PAI-P-1602168

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