4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

George M. Braceras

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Active restore weak write test mode

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Active restore weak write test mode

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Adaptive integrated circuit based on transistor current...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Adaptive integrated circuit based on transistor current...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus and method for improved SRAM device performance...

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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Profile ID: LFUS-PAI-P-332360

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