Adaptive integrated circuit based on transistor current...

Details Adaptive integrated circuit based on transistor current... Adaptive integrated circuit based on transistor current...

2005-05-24

2005-05-24

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010

Reexamination Certificate

active

06897674

ABSTRACT:
A method of tuning an integrated circuit on an integrated circuit chip including: performing a drain current at saturation measurement of one or more test field effect transistors on the integrated circuit chip; selectively programming fuses of a bank of fuses on the integrated circuit chip based on the drain current at saturation measurement; and tuning an output of the integrated circuit based on a pattern of blown and un-blown fuses in the bank of fuses.

REFERENCES:
patent: 4816757 (1989-03-01), Hutchins
patent: 6720785 (2004-04-01), Bette
patent: 6762608 (2004-07-01), Damon et al.

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