4. Electrical transmission or interconnection systems
  5. Nonlinear reactor systems
  6. Parametrons

George A. Katopis

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Early high level net based analysis of simultaneous switching

Boots – shoes – and leggings
Patent

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Method for dynamic bandwidth testing

Multiplex communications – Diagnostic testing – Using oam cells
Patent

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Multiple power density chip structure

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With provision for cooling the housing or its contents
Reexamination Certificate

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On-chip Delta-I noise clamping circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent

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System and method implementing short-pulse propagation...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-817435

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