4. Semiconductor device manufacturing: process
  5. Making field effect device having pair of active regions...
  6. Having insulated gate

Gaurav Verma

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Apparatus and methods for detection of systematic defects

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
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Apparatus and methods for determining and localization of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Apparatus and methods for predicting multiple product chip...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
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Apparatus and methods for reliable and efficient detection...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Apparatus and methods for semiconductor IC failure detection

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
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Profile ID: LFUS-PAI-P-2113348

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