4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Gary L. Dodd

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Non-volatile counter employing memory cell groups and fault dete

Electrical pulse counters – pulse dividers – or shift registers: c – Systems – Identifying or correcting improper counter operation
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Non-volatile RAM bit cell

Static information storage and retrieval – Read/write circuit – Testing
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Profile ID: LFUS-PAI-P-1175603

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