4. Optics: measuring and testing
  5. By polarized light examination
  6. Of surface reflection

Gary Janik

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Film thickness and composition measurement via auger...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
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Film thickness and composition measurement via auger...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Method and apparatus for improved x-ray reflection measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Methods and apparatus for characterizing thin films

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Optical system for measuring samples using short wavelength...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Profile ID: LFUS-PAI-P-2363950

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