4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Garbiel Daniel

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Method of making a memory device fault tolerant using a variable

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Variable domain redundancy replacement configuration for a memor

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent

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Profile ID: LFUS-PAI-P-1395808

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