4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Gabi Glasser

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Die fault testing utilizing an exclusive-or network of gates

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Statistical counters in high speed network integrated circuits

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Synchronizing signals between clock domains

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates
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Profile ID: LFUS-PAI-P-2762896

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