4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Fulbright & Jaworski LLC

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System and method for multiple cycle capture of chip state

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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System and method for multiple cycle capture of chip state

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Window-type semiconductor package and fabrication method...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With semiconductor element forming part
Reexamination Certificate

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