4. Metal working
  5. Barrier layer or semiconductor device making
  6. Barrier layer device making

Frederick P. Pickett

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Electron impact ion source for trace analysis

Electricity: measuring and testing – Using ionization effects – For analysis of gas – vapor – or particles of matter
Patent

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Mandrel for formation of mass spectrometer filter

Static molds – Uniting preform with molding material – Preform supported by hole or recess in mold wall or surface
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Mass spectrometer filter

Metal working – Barrier layer or semiconductor device making – Barrier layer device making
Patent

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Mass spectrometer filter

Radiant energy – Ionic separation or analysis – Cyclically varying ion selecting field means
Patent

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Profile ID: LFUS-PAI-P-1102655

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