Electron impact ion source for trace analysis

Details Electron impact ion source for trace analysis Electron impact ion source for trace analysis

1985-11-14

1987-08-25

Eisenzopf, Reinhard I.

Electricity: measuring and testing

Using ionization effects

For analysis of gas, vapor, or particles of matter

250427, 324470, G01N 2762

Patent

active

046895744

ABSTRACT:
An apparatus is disclosed for analyzing trace elements in a gas sample. A unique feedback system is provided for accurately regulating and sensing the pressure supplied to the ion chamber of the device. The feedback system is capable of compensating for a wide range of input gas pressures. The apparatus also includes an improved closed ion source which is resistant to corrosion and aids in the reduction of noise. In addition, a method is disclosed to calibrate the detector for accurately scaling the measurements of trace elements.

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patent: 4460317 (1984-07-01), Kern et al.
patent: 4529571 (1985-07-01), Bacon et al.

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