4. Measuring and testing
  5. With fluid pressure
  6. Leakage

Frank S Geefay

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Method and apparatus for hermeticity determination and leak...

Measuring and testing – With fluid pressure – Leakage
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Sloped via contacts

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Wafer-level package with silicon gasket

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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Wafer-level package with silicon gasket

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Including adhesive bonding step
Reexamination Certificate

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