Active solid-state devices (e.g., transistors, solid-state diode
Specified wide band gap semiconductor material other than...
Diamond or silicon carbide
Inventor
active
Layered structure of a substrate, a dielectric layer and a singl
Line monitoring of negative bias temperature instabilities...
Method and circuit for element wearout recovery
Method and structure for in-line monitoring of negative bias...
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Profile ID: LFUS-PAI-P-136804