4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Evgeni Levin

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Method for detecting defects

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method for detecting defects

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method for detecting defects

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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System and method for process variation monitor

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Reexamination Certificate

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System and method for process variation monitor

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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