4. Semiconductor device manufacturing: process
  5. Coating of substrate containing semiconductor region or of...
  6. Combined with the removal of material by nonchemical means

Evan Pert

Examiner

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150 degree bump placement layout for an integrated circuit...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Configuration or pattern of bonds
Reexamination Certificate

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Abrupt metal-insulator transition device with parallel MIT...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
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Abrupt metal-insulator transition device, circuit for...

Electricity: electrical systems and devices – Safety and protection of systems and devices – Transient responsive
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Abrupt power change method of preventing an integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Active coupler

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With waveguide or long line
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Profile ID: LFUS-PAI-P-207342

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