4. Coating apparatus
  5. Gas or vapor deposition

Eugene Fukshansky

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Apparatus for measuring of thin dielectric layer properties...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Lid assembly for high temperature processing chamber

Coating apparatus – Gas or vapor deposition
Patent

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Pressure responsive clamp for a processing chamber

Receptacles – Closures – With condition responsive vent or valve
Patent

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Profile ID: LFUS-PAI-P-1110607

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