4. Coating processes
  5. Electrical product produced
  6. Metal coating

Eugene A. Delenia

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Imaging integrated circuits with focused ion beam

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Selective etch for uniform metal trace exposure and milling...

Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Reexamination Certificate

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TiW barrier metal process

Coating processes – Electrical product produced – Metal coating
Patent

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Profile ID: LFUS-PAI-P-804732

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