4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Eshwar Gollapudi

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Automatic self test of an integrated circuit component via...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Push button mode automatic pattern switching for...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2757767

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