4. Optical: systems and elements
  5. Diffraction
  6. Using fourier transform spatial filtering

Erland T. Sandstrom

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Ellipsometric method and apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Ellipsometric method and apparatus for studying physical propert

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for studying surface properties

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Optical spatial filtering for attenuating the zero diffractive o

Optical: systems and elements – Diffraction – Using fourier transform spatial filtering
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Erland T. Sandstrom does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Erland T. Sandstrom, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Erland T. Sandstrom will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-1142908

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure