4. Electricity: measuring and testing
  5. Magnetic
  6. With means to create magnetic field to test material

Eng Fong Chor

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Embedded polysilicon gate MOSFET

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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End of range (EOR) secondary defect engineering using...

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate

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End of range (EOR) secondary defect engineering using...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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End of range (EOR) secondary defect engineering using...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Method and apparatus to image metallic patches embedded in a non

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
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Profile ID: LFUS-PAI-P-454733

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