Method and apparatus to image metallic patches embedded in a non

Details Method and apparatus to image metallic patches embedded in a non Method and apparatus to image metallic patches embedded in a non

1998-07-13

2000-05-16

Strecker, Gerard

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324226, 324235, 3242441, 324256, 324259, 324262, 324762, G01N 2790, N01R 3300, N01R 3312, N01R 3100, G01V 300

Patent

active

060642017

ABSTRACT:
Small metallic patches embedded in a mainly non-metallic surface may be detected and mapped by placing a wire coil at the free end of a cantilever, with a fine tip made of a ferro-magnetic material located at its center. An alternating current is passed through the coil so that when it is near a metallic patch eddy currents are induced in the patch. These produce a small magnetic moment in the patch which pulls the tip towards the surface. This movement of the tip is detected by observing a light beam that is reflected off the surface of the cantilever. By plotting the output of a photodetector, sensistive to small changes in the reflected beam's position, as a function of the tip's location over the surface, a map of the metallic patches is produced.

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patent: 5900728 (1999-05-01), Moser et al.
patent: 5900729 (1999-05-01), Moser et al.

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