4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Responsive to non-electrical signal
  6. Temperature

Eiichi Sakao

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Method for predicting an output current of a transistor

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Semiconductor protection circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Temperature
Patent

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Profile ID: LFUS-PAI-P-381968

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