Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-01-18
1997-05-13
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3126
Patent
active
056296339
ABSTRACT:
An output current of a transistor can be predicted by a method of the present invention. A direct current amplification factor H.sub.FE (I.sub.D) of the transistor is varied depending on the output current. H.sub.FE0 is a direct current amplification factor of the transistor at a predetermined output current. H.sub.FE (I.sub.D)/H.sub.FE0 is drawn on a graph. A value of an output current at a driving voltage is obtained by regarding the factor as a predetermined value. The value is plotted on the graph and a straight line is drawn between the plotted value and an origin of the graph. An output current at an intersection of a curve of H.sub.FE (I.sub.D)/H.sub.FE0 and a straight line.
REFERENCES:
patent: 4456880 (1984-06-01), Warner et al.
patent: 4782290 (1988-11-01), Sakai et al.
patent: 4818934 (1989-04-01), Tamamura
Karlsen Ernest F.
Rohm & Co., Ltd.
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