Static information storage and retrieval
Floating gate
Data security
Inventor
active
Address sequencer within BIST (Built-in-Self-Test) system
Application of external voltage during array VT testing
CAM (content addressable memory) cells as part of core array...
Charge sharing to help boost the wordlines during APDE verify
Diagnostic mode for testing functionality of BIST...
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Profile ID: LFUS-PAI-P-2054166