4. Image analysis
  5. Applications
  6. Personnel identification

Edward Paul Martin, Jr.

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Electronic apparatus having improved scratch and mechanical...

Image analysis – Applications – Personnel identification
Reexamination Certificate

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Structure and method for improved heat conduction for...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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Structure and method for improved heat conduction for...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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Test structure and method for yield improvement of double...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2058891

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