Douglas G. Waltz

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Optical testing system for distinguishing a silicon carbide gems

Optics: measuring and testing – Crystal or gem examination
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Packaged diode for high temperature operation

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System and method for accelerated degradation testing of semicon

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-651953

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