Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
Inventor
active
Low yield analysis of embedded memory
Method and apparatus for direct access test of embedded memory
Method and apparatus for software controlled timing of...
Programmable weak write test mode
No associations
LandOfFree
Douglas A. Guddat does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Douglas A. Guddat, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Douglas A. Guddat will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2122567