4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified material other than unalloyed aluminum

Dorel Ioan Toma

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Method and system for characterizing porous materials

Coating processes – Measuring – testing – or indicating
Reexamination Certificate

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Method and system for characterizing porous materials

Coating processes – Measuring – testing – or indicating
Reexamination Certificate

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Method and system for treating a dielectric film

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of...
Reexamination Certificate

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Method for treating a dielectric film

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate

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Method of passivating of low dielectric materials in wafer...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3017171

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