4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Gating
  6. Signal transmission integrity or spurious noise override

Ding-Ming Kwai

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Built-in-self-test circuit for RAMBUS direct RDRAM

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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High speed built-in self-test circuit for DRAMS

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Isolation circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Signal transmission integrity or spurious noise override
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2313157

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