4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Dinesh D. Gaitonde

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Architectural power estimation method and apparatus

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent

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Method and apparatus for generating sign-off prototypes for...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Timing analysis of a mapped logic design using physical delays

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-536559

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