4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Dieter Härle

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Configuration for testing a plurality of memory chips on a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Optimized-delay multiplexer

Electronic digital logic circuitry – Function of and – or – nand – nor – or not – Decoding
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2602869

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