4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Devanathan Varadarajan

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Efficient calculation of a number of transitions and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Scan-enabled method and system for testing a system-on-chip

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan technique for testing integrated circuits...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan technique providing enhanced fault coverage...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Sequential scan technique providing enhanced fault coverage...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2354503

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