Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-10-02
2007-10-02
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C714S047300, C702S186000, C703S023000
Reexamination Certificate
active
11306598
ABSTRACT:
Determining the transition counts at various scan elements of a scan chain (for sequential scan tests) by merely examining the bits of an input vector and the expected results of evaluation. In an embodiment, assuming there are N bits of input vector (with the Nth bit being scanned in first and first bit being scanned in last) and N elements of a scan chain (with the first scan element receiving each bit first), the number of transition at Nth scan element equals an XOR of the Nth bit and the bit stored in the first scan element before scan-in operation. The number of transitions at Pth scan element then equals a sum of (XOR of (P+1)st bit and (Pth bit)) and the number of the transitions at the (P+1)st element. The transitions due to scan out operations can also be similarly determined. The computed number of transitions can be used for determining power dissipation during sequential scan test.
REFERENCES:
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patent: 6501288 (2002-12-01), Wilsher
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Joseph N. Kozhaya and Farid N. Najm, “Power Estimation for Large Sequential Circuits”, from IEEE journal, pp. 400-406, IEEE Transactions on Very Large Scale Integration (VLSI) Systems ,vol. 9, No. 2, Apr. 2001.
Ranganathan Sankaralingam, Rama Rao Oruganti, and Nur A. Touba, “Static Compaction Techniques to Control Scan Vector Power Dissipation”, pp. 1-6, Computer Engineering Research Center, University of Texas, Austin, TX 78712-1084, 2000.
Thirunavukarasu Senthil Arasu
Varadarajan Devanathan
Brady W. James
Nghiem Michael P.
Stewart Alan K.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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