4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Dennis Kiyoshi Hara

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RFID tag design with circuitry for wafer level testing

Communications: electrical – Condition responsive indicating system – Specific condition
Reexamination Certificate

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RFID tag with bist circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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RFID tag with bist circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semi-static flip-flops for RFID tags

Electronic digital logic circuitry – Function of and – or – nand – nor – or not – Decoding
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2372377

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