4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Thin active physical layer which is

David Stumbo

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Deflection noise reduction in charged particle beam lithography

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate

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Interferometer system

Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate

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Interferometer system for a semiconductor exposure system

Photocopying – Projection printing and copying cameras – Illumination systems or details
Reexamination Certificate

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Large-area nanoenabled macroelectronic substrates and uses...

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is
Reexamination Certificate

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Large-area nonenabled macroelectronic substrates and uses...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Profile ID: LFUS-PAI-P-2318211

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