Measuring and testing
Surface and cutting edge testing
Roughness
Inventor
active
Apparatus and method for modifying an object
Apparatus and method for modifying an object
Automatic gain control circuit for encoder
Detecting system for scanning microscopes
Detection system for atomic force microscopes
No associations
LandOfFree
David J. Ray does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with David J. Ray, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and David J. Ray will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-480518